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DS: Fachverband Dünne Schichten

DS 44: Postersession II

DS 44.37: Poster

Donnerstag, 23. März 2017, 17:00–19:00, P1C

Combined local electrical and optical measurements of individual semiconductor nanosheets — •Andreas Kolditz, Christian Strelow, Tobias Kipp, and Alf Mews — University of Hamburg, Institute of Physical Chemistry, Grindelallee 117, 20146 Hamburg, Germany

Tin(II) sulfide or tin(II) selenide are very attractive IV-VI semiconductor materials because of the natural abundance and low toxicity. In particular, two-dimensional (2D) nanosheets of these materials are promising for photovoltaics as well as for light-emitting applications. We investigate the optical and electrical characteristics of individual 2D nanosheets by combining scanning electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) with electrical transport and fluorescence measurements. This combination allows us to investigate the effect of band bending on the photo current and also the effects of external charging on the fluorescence properties of individual structures. In first EFM measurements on SnSe nanosheets under local illumination we observed a separation of the photoexcited electrons and holes within the nanosheets. In detail the EFM measurements showed positive excess charges at the excitation area and negative excess charges distributed everywhere else.