Dresden 2017 – scientific programme

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DS: Fachverband Dünne Schichten

DS 44: Postersession II

DS 44.40: Poster

Thursday, March 23, 2017, 17:00–19:00, P1C

Photoluminescence imaging of few-layer transition metal dichalcogenides — •Victor Funk, Michael Förg, and Alexander Högele — Ludwig-Maximilians-Universität, München, Deutschland

Transition metal dichalcogenides (TMDs) are novel two-dimensional semiconductor materials with unique optoelectronic properties (1). A crucial step in the fabrication of mono- and multilayer TMD devices is the classification of the number of layers of TMD crystals exfoliated on a polydimethylsiloxane (PDMS) stamp for transfer (2). We report a simple and reliable method for the identification of individual monolayers by means of two-dimensional photoluminescence imaging. Our techniuqe, established for four representative materials of TMD semiconductors and calibrated with layer-sensitive Raman spectroscopy, enables rapid characterization of the crystal layer thickness prior to subsequent transfer onto target substrates.

(1) T. Cao et al., Nature Communications, 3, 887 (2012) (2) A. Castellanos-Gomes et al., 2D Materials, 1, 2053 (2014)