Dresden 2017 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 16: Ultrafast Phenoma II
HL 16.5: Talk
Monday, March 20, 2017, 16:30–16:45, POT 51
Material Science applications at ELI Beamlines: VUV transient ellipsometry — •Shirly Espinoza1, Michael Rübhausen1,2, and Jakob Andreasson3 — 1ELI Beamlines, Institute of Physics, Czech Academy of Science, Na Slovance 2, 182 21 Prague, Czech Republic — 2Condensed Matter Physics, Department of Physics, Chalmers University of Technology, Kemigården 1, SE-412 96 Göteborg, Sweden — 3Institute for Nanostructures and Solid State Physics, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
In this talk, an introduction to the ELI Beamlines User Facility, to the material science end stations, and to the VUV transient ellipsometry technique will be presented. ELI Beamlines (ELI-BL) is a user facility being built in Prague, Czech Republic, as one of the three pillars of the transnational European Extreme Light Infrastructure (ELI) project that will hold some of the most intense lasers in the world. At EL-BL, high power lasers drive secondary sources (Plasma X-ray and High Harmonic Generation) that allow the study of transient processes in solid state materials. The planned end stations include Transient X-ray Diffraction, X-ray Absorption Spectroscopy, VUV ellipsometry and Transient Optical Spectroscopy (absorption and Raman). Time-resolved transient measurements are possible in the range of a few femtoseconds to hundred of picoseconds. Currently, experiments with transient absorption and transient ellipsometry in the UV-Visible range are being performed on semiconductor materials. Using these results, the advantages of the time-resolved techniques will be explained.