Dresden 2017 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 64: Poster: Photovoltaics and Optics

HL 64.39: Poster

Mittwoch, 22. März 2017, 15:00–19:00, P1C

Absolute distance semiconductor laser self-interferometry towards microscopy object position detection — •Daniel Hartnagel, Christoph Weber, and Stefan Breuer — Institute of Applied Physics, Technische Universität Darmstadt, Schlossgartenstr. 7, 64289 Darmstadt, Germany

The precise knowledge of the location of a microscopic object under investigation in nonlinear confocal imaging microscopy is crucial for allowing a concise series of microscopic images. Non-contact high-precision measurement techniques involving triangulation or mechanical position sensing cannot immediately be employed due to the dimension restrictions in the microscopes sample holder. We study a compact semiconductor laser based concept for absolute distance interferometry that is expected to cope with the stringent requirements. An experiment involving a directly modulated commercial diode laser emitting at 1310 nm is presented where the absolute distance can be retrieved by the measured interference frequency and parameters. The results are then validated by spectro-temporal and time-domain analysis. The obtained results suggest paths towards future development and implementation of semiconductor laser based absolute distance interferometry concepts. Support by the Support Initiative Interdisciplinary Science (FiF) of the Technische Universität Darmstadt and the Adolf-Messer Foundation, Germany, is thankfully acknowledged.