Dresden 2017 – wissenschaftliches Programm

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KR: Fachgruppe Kristallographie

KR 2: X-Ray Imaging, Holography, Ptychography and Tomography (with MI)

KR 2.1: Hauptvortrag

Mittwoch, 22. März 2017, 09:30–10:00, MER 02

X-ray Microscopy: Imaging the Chemistry Inside — •Christian G. Schroer — Photon Science, DESY, Notkestr. 85, 22607 Hamburg — Institut für Nanostruktur- und Festkörperphysik, Universität Hamburg, Jungiusstr. 11, 20355 Hamburg

One key strength of hard X-ray microscopy is that it can image the inner structures of an object without destructive sample preparation. Exploiting various X-ray analytical contrasts, such as fluorescence, diffraction, and absorption, the elemental, structural, and chemical information can be obtained from inside a sample, e. g., a chemical reactor. Conventional X-ray microscopy is currently limited by X-ray optics to a few tens of nanometers. One way to overcome this limitation is scanning coherent X-ray diffraction microscopy also known as ptychography [1]. It can be combined with spectroscopy to obtain chemical information on a given element of interest [2]. In combination with tomography, the three-dimensional structure of an object can be reconstructed with unprecedented spatial resolution [3]. Here, an overview is given over multimodal X-ray imaging for materials research at modern synchrotron radiation sources.

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[2] R. Hoppe, et al., Appl. Phys. Lett. 102, 203104 (2013).

[3] M. Dierolf, et al., Nature 467, 436 (2010); M. Holler, et al., Scientific Reports 4, 3857 (2014).