KR 2: X-Ray Imaging, Holography, Ptychography and Tomography (with MI)
Mittwoch, 22. März 2017, 09:30–11:30, MER 02
 |
09:30 |
KR 2.1 |
Hauptvortrag:
X-ray Microscopy: Imaging the Chemistry Inside — •Christian G. Schroer
|
|
|
|
10:00 |
KR 2.2 |
Imaging with hard X-rays and Nanometer Resolution using Multilayer Zone Plates — •Jakob Soltau, Christian Eberl, Tim Salditt, Hans-Ulrich Krebs, and Markus Osterhoff
|
|
|
|
10:15 |
KR 2.3 |
The Fluence-Resolution Relationship in Holographic and Coherent Diffractive Imaging — •Johannes Hagemann and Tim Salditt
|
|
|
|
10:30 |
KR 2.4 |
Simulations towards high magnification setups in X-ray Talbot-interferometry — •Andreas Wolf, Veronika Ludwig, Jens Rieger, Max Schuster, Maria Seifert, Georg Pelzer, Thilo Michel, Gisela Anton, and Stefan Funk
|
|
|
| |
10:45 |
|
15 min. break
|
|
|
|
11:00 |
KR 2.5 |
X-Ray Phase-Contrast Tomography with Anisotropic Source Conditions — •Malte Vassholz, Leon Merten Lohse, and Tim Salditt
|
|
|
|
11:15 |
KR 2.6 |
Core-shell-shell nanowires studied by coherent x-ray nano-beam — •Arman Davtyan, Vincent Favre-Nicolin, Ryan B. Lewis, Hanno Küpers, Lutz Gelhaar, Dominik Kriegner, Ali Al-Hassan, Otmar Loffeld, and Ullrich Pietsch
|
|
|