MI 1: Analytical Electron Microscopy: SEM and TEM-based Material Analysis
Monday, March 20, 2017, 10:00–13:00, MER 02
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10:00 |
MI 1.1 |
Invited Talk:
Point-group sensitive interpretation of EBSD patterns, and the impact of channeling-in and channeling-out of electrons — •Gert Nolze and Aimo Winkelmann
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10:30 |
MI 1.2 |
The Complicated Information Depth of EBSD — •Wolfgang Wisniewski
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10:45 |
MI 1.3 |
Quantitative materials characterization at the nanoscale with TKD in SEM — •Laurie Palasse and Daniel Goran
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11:00 |
MI 1.4 |
Cryo-EBSD on BaFe2As2 single crystals — •Aurimas Pukenas, Paul Chekhonin, Ellen Hieckmann, Martin Meißner, Saicharan Aswartham, Jan Engelmann, Bernhard Holzapfel, Sabine Wurmehl, Bernd Büchner, and Werner Skrotzki
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11:15 |
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15 min. break.
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11:30 |
MI 1.5 |
Angle-resolved X-ray fluorescence spectroscopy for elemental depth profiling with nanometer resolution — •Ioanna Mantouvalou, Jonas Baumann, Veronika Swedowski, Malte Spanier, Steffen Staeck, Daniel Grötzsch, Wolfgang Malzer, and Birgit Kanngießer
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11:45 |
MI 1.6 |
Analysis on nanostructures and samples with high topography using low acceleration voltages — •Max Patzschke
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12:00 |
MI 1.7 |
Identification of laminates in 10 M martensite Ni-Mn-Ga magnetic shape memory single crystals — •Jaromír Kopeček, Ladislav Klimša, Ladislav Straka, Jan Drahokoupil, Petr Veřtát, Vít Kopecký, Hanuš Seiner, Martin Zelený, and Oleg Heczko
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12:15 |
MI 1.8 |
Invited Talk:
Microstructural characterization of non-metallic precipitates in silicon crystallization processes for photovoltaic applications — •Susanne Richter, Martina Werner, Sina Swatek, and Christian Hagendorf
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12:45 |
MI 1.9 |
Quantitative high-resolution off-axis electron holography of 2D materials — •Florian Winkler, Juri Barthel, Sven Borghardt, Amir H. Tavabi, Emrah Yucelen, Beata E. Kardynal, and Rafal E. Dunin-Borkowski
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