MI 8: Scanning Probe Microscopy (SPM)
Donnerstag, 23. März 2017, 10:00–11:00, MER 02
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10:00 |
MI 8.1 |
Machine Learning in Spectroscopic Scanning Probe Microscopy: a Magnetoelectric Composite Case Study — •Harsh Trivedi, Vladimir V. Shvartsman, Doru C. Lupascu, and Robert C. Pullar
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10:15 |
MI 8.2 |
Potential dependent tunneling barrier-height measurements at the interface of gold(111) in an ionic liquid — •Marcel Lang, Jeannette Lindner, and Rolf Schuster
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10:30 |
MI 8.3 |
Scanning Microwave Microscopy and its application to nanoscale dopant density determination — •Arne Buchter, Johannes Hoffmann, Dimitri Hapiuk, Christophe Licitra, Kevin Louarn, Guilhem Almuneau, and Markus Zeier
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10:45 |
MI 8.4 |
A Quantitative Model for the Ion Current vs. Distance Behavior in Scanning Ion Conductance Microscopy — •Johannes Rheinlaender and Tilman E. Schäffer
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