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O: Fachverband Oberflächenphysik

O 106: Electronic Structure of Surfaces: Spectroscopy, Surface States III

O 106.5: Vortrag

Freitag, 24. März 2017, 11:30–11:45, WIL C107

Non-contact and non-destructive surface analytical tool - The Kelvin Probe: Basics to recent advances — •Subrahmanyam Aryasomayajula — Department of Physics, Indian Institute of Technology Madras, Chennai 600036 India

The surface of metals and semiconductors pose unique challenges in their understanding. Most of the surface analytical tools do modify the surfaces. The Kelvin probe is a most powerful non-contact and non-destructive analytical tool for surface engineering of the metal and semiconductor surfaces; the surface remains virgin even after the measurement. The Kelvin probe technique measures the surface work-function (which is sensitive to the surface preparation). The technique has the unique advantage to follow the real time changes that are taking place on the surface. The Kelvin probe technique is so versatile, it is being employed in several areas: electronic behavior of surfaces of metals and semiconductors,tribology, inter-facial phenomena, adhesion, corrosion,electro-chromic behavior, surface defects and morphology and bacterial bio-film adherence etc,. The present work describes the basics and explores new areas like the failure analyses of corrosion in bio-medical implants (semiconductor - bio-fluid interactions).