O 40: Focus Session: Charge Transport at Surfaces and Nanostructures with Multi-probe Techniques II
Dienstag, 21. März 2017, 14:00–15:15, WIL C307
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14:00 |
O 40.1 |
Hauptvortrag:
Performances of the new low temperature ultrahigh vacuum 4 scanning tunneling microscopes — •christian Joachim, Delphine Sordes, Corentin Durand, We-Hyo Soe, and Marek Kolmer
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14:30 |
O 40.2 |
New Perspectives in Scanning Tunneling Potentiometry — Philip Willke, Thomas Kotzott, Jan Voigt, Rainer G. Ulbrich, M. Alexander Schneider, Thomas Pruschke, and •Martin Wenderoth
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14:45 |
O 40.3 |
Kelvin probe force microscopy as a tool to measure local transport properties in graphene on SiO2 — Philip Willke, •Anna Sinterhauf, Christian Möhle, Thomas Kotzott, Hak Ki Yu, Alec Wodtke, and Martin Wenderoth
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15:00 |
O 40.4 |
Two-probe measurements on the atomic scale wires: ballistic transport through surface states of Ge(001) — •Marek Kolmer, Piotr Olszowski, Rafal Zuzak, Szymon Godlewski, Christian Joachim, and Marek Szymonski
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