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O: Fachverband Oberflächenphysik

O 46: Electronic Structure of Surfaces: Spectroscopy, Surface States

O 46.12: Poster

Dienstag, 21. März 2017, 18:30–20:30, P1A

A new dual analyzer system for surface analysis of liquids under UHV conditions — •Francesco Greco, Inga Niedermaier, Claudia Kolbeck, Hans-Peter Steinrück, and Florian Maier — Lehrstuhl für Physikalische Chemie II, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstr. 3, 91058 Erlangen

In the last decade, ionic liquid (IL) systems have emerged for UHV studies of liquid surfaces and interfaces due to the extremely low IL vapor pressure. It has been demonstrated that particularly angle-resolved X-ray Photoelectron Spectroscopy (ARXPS) allows for investigating phenomena that occur at gas-liquid and liquid-solid interfaces on the molecular level. In all of these ARXPS studies, the sample holder had to be tilted in order to change the polar detection angle of the emitted photoelectrons, which restricted the investigations to very thin and high-viscous IL films only. We here report on a new and unique laboratory "Dual Analyzer System for Surface Analysis (DASSA)" which enables fast ARXPS, UV photoelectron spectroscopy, imaging XPS, and low-energy ion scattering of macroscopically thick non-volatile liquid samples.[1] As core element, it comprises a UHV analysis chamber equipped with two electron analyzers mounted for simultaneous measurements in 0° and 80° emission relative to the surface normal for horizontally mounted IL samples.

F.G. and H.P.S. thank the ERC for financial support through an Advanced Investigator Grant to H.P.S.!

[1] I. Niedermaier, C. Kolbeck, H.-P. Steinrück, F. Maier, Rev. Sci. Instrum. 87 (2016) 045105