Dresden 2017 – scientific programme
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O: Fachverband Oberflächenphysik
O 52: Nanostructures at Surfaces: Dots, Particles, Clusters
O 52.7: Poster
Tuesday, March 21, 2017, 18:30–20:30, P1C
Nanoparticle Adhesion and Optical Particle Motion Control — •Michaela Schmid1, Daniel Geiger1, Clara Wanjura1, Irina Schrezenmeier1, Matthias Roos2, and Othmar Marti1 — 1Institute of Experimental Physics, Ulm University, Albert-Einstein-Allee 11, 89081 Ulm, Germany — 2Carl Zeiss SMT GmbH, Rudolf-Eber-Strasse 2, 73447 Oberkochen, Germany
The adhesion of nanoparticles on substrates like silicon wafers is of high interest for a variety of scientific and industrial applications. To determine adhesion, a method based on lateral pushing of nanoparticles by an atomic force microscope (AFM) tip was used. The lateral force acting on the cantilever by the particle is then a function of its adhesion force to the substrate.
However, the nature of the detachment and moving process remains unclear. Additional experiments are necessary to distinguish between rolling, sliding or jumping motion. These processes are investigated by simultaneous optical observation. Using total internal reflection (TIR) illumination, the scattering intensity of the bead contains the distance information from bead to substrate. Partially fluorescent particles allow to distinguish between rolling and sliding motion [1].
[1] S. Schiwek et al, Evidence of a rolling motion of a microparticle on a silicon wafer in a liquid environment, J. of Appl. Phys. 119, 194304 (2016)