Dresden 2017 – scientific programme

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O: Fachverband Oberflächenphysik

O 55: Graphene

O 55.7: Poster

Tuesday, March 21, 2017, 18:30–20:30, P2-EG

Role of the tunnelling junction elements in photon emission from Au/Mica, Au/Cr/Mica, graphene/Cu systems — •Hakki Tunç Çiftçi¹, Berk Zengin¹, Umut Kamber¹, Cem Kincal¹, Dilek Yildiz^{1, 2}, and Oğuzhan Gürlü¹ — ¹Istanbul Technical University, Istanbul, Turkey — ²University of Basel, Basel, Switzerland

Photon emission occurrence from the tunnel junction relies on the material, apex and the cleanness of the tip of a scanning tunnelling microscope (STM). Certainly the surface electronic properties of the sample as well as its morphology directly determines the nature of the emitted photons. Minute and almost untraceable variance of chemical composition of the surfaces has a serious effect on the same phenomenon. For instance, chromium diffusion on to the surface in the Au/Cr/Mica system was shown to affect the local photon emission properties of the Au surface due to tunnelling injected electrons. The knowhow gathered from such studies was employed in the investigation of the photon emission measurements performed with a photon STM on Graphene/Copper system. Being able to identify the influence of tip effects and the local chemistry of the surface paved the way to a deconvoluted method of investigation of the correlation between photon emissivity of Graphene/Cu interface to the local surface orientation.