Dresden 2017 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 56: 2D Materials beyond Graphene
O 56.18: Poster
Dienstag, 21. März 2017, 18:30–20:30, P2-EG
Spectroscopic Mapping and Imaging Ellipsometry applied to Conducting, Semi-Conducting and Insulating 2D-Materials — Sebastian Funke1, Ursula Wurstbauer2,3, Aleksandar Matkovic4, Avery Green5, and •Peter H. Thiesen1 — 1Accurion GmbH, Stresemanstraße 30, 37079 Göttingen, Germany — 2Walter Schottky Institute and Physics-Department, TU München, Garching 85748, Germany — 3Nanosystems Initiative Munic 80799, Germany — 4Centre for Solid State Physics and New Materials, Institute of Physics, University of Belgrade, Pregrevica 118, 11080 Belgrade, Serbia — 5College of Nanoscale Science and Engineering, State University of New York, 253 Fuller Road, Albany, New York 12203
The poster will present the localization and characterization of Graphene Monolayer flakes and similar thicknesses regions of insulating hexagonal boron nitride (hBN) and on semiconducting transition metal dichalcogenide Molybdenum disulphide (MoS2).
Matkovic et al. characterized monolayers of graphene by spectroscopic imaging ellipsometry (SIE). The resulting Fano resonance modelling for the dispersion of Graphene can be used to search for flakes of graphene on different substrates, based on the spectroscopic mapping of the ellipsometric angles Δ and Ψ. This ellipsometric flakesearch is less dependent from the substrate compared to e.g. conventional light microscopy.