Dresden 2017 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 64: Scanning Probe Techniques: Method development
O 64.7: Poster
Dienstag, 21. März 2017, 18:30–20:30, P2-OG3
Fast and Reliable Pre-Approach for Scanning Probe Microscopes based on Tip-Sample Capacitance — Marc de Voogd1, Matthijs van Spronsen1, Floris Kalff2, Ben Bryant2, Oliver Ostojic1, Arthur den Haan1, Irene Groot1, 3, Tjerk Oosterkamp1, Sander Otte2, and •Marcel Rost1 — 1Leiden Institute of Physics, Leiden University, P.O. Box 9504, 2300 RA Leiden, the Netherlands — 2Department of Quantum Nanoscience, Kavli Institute of Nanoscience,Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands — 3Leiden Institute of Chemistry, Leiden University,P.O. Box 9502, 2300 RA Leiden, the Netherlands
Within the last three decades Scanning Probe Microscopy has been developed to a powerful tool for measuring surfaces and their properties. However, despite continuous improvements, the time required for a safe approach can still be very time consuming, especially if the microscope is not equipped or suited for the observation of the tip-sample distance with an additional optical microscope. Here we show that the measurement of the tip-sample capacitance provides an ideal solution for a fast and reliable pre-approach. The tip-sample capacitance shows a generic behavior as a function of the distance, even though we measured it on several completely different setups. Insight into this behavior is gained via an analytical and computational analysis, from which two additional advantages arise: the capacitance measurement can be applied for observing, analyzing, and re-tuning of the approach motor, as well as for the determination of the (effective) tip radius.