Dresden 2017 – scientific programme

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O: Fachverband Oberflächenphysik

O 64: Scanning Probe Techniques: Method development

O 64.9: Poster

Tuesday, March 21, 2017, 18:30–20:30, P2-OG3

Advances in scanning field-emission microscopy — •Danilo A. Zanin, Hugo Cabrera, Gabriele Bertolini, Lorenzo G. De Pietro, Alessandro Vindigni, Thomas Bähler, Oguzhan Gürlü, Mehmet Erbudak, Urs Ramsperger, and Danilo Pescia — ETH Zurich, Zurich, Switzerland

The impact of Scanning Tunneling Microscopy (STM) to nanotechnology continues to be undisputed, but this does not prevent the search for new methods with the aim of revealing aspects complementary to those highlighted by STM. Inspired by the Russel Young topografiner we designed the Scanning Field-emission Microscopy (SFM) to analyze secondary electron escaping a tip-target nano-sized junction. On one side, SFM detects "non-geometrical" aspects of the surface, which are not straightforwardly revealed by STM. On the other side, those very same electrons used to build a one-nanometer-resolved image of a surface are ultimately made available to a macroscopic environment for further processing. We report on the latest result of this technique.