Dresden 2017 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 69: Plasmonics and Nanooptics VI: Light-Matter Interactions and Characterisation
O 69.7: Vortrag
Mittwoch, 22. März 2017, 12:00–12:15, TRE Ma
Imaging with SNOM and EELS in plasmonics — •Vlastimil Křápek1,2, Petr Dvořák1,2, Ai Leen Koh3, Zoltán Édes1,2, Michal Horák1,2, Michal Kvapil1,2, Lukáš Břínek1,2, Tomáš Šamořil1,2, Martin Hrtoň1,2, and Tomáš Šikola1,2 — 1Central European Institute of Technology, Brno University of Technology, Purkyňova 123, CZ-612 00 Brno, Czech Republic — 2Institute of Physical Engineering, Brno University of Technology, Technická 2, CZ-616 69 Brno, Czech Republic — 3Stanford Nano Shared Facilities, Stanford University, Stanford, California 94305, USA
Scanning near-field optical microscopy (SNOM) is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs) [1]. However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements of plasmon interference patterns by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images.
Electron energy loss spectroscopy (EELS) is a technique for imaging of localized plasmon resonances with unprecedented spatial resolution. We present our EELS imaging of gold plasmonic particles suitable for the enhancement of optical processes [2].
[1] P. Dvořák et al., Nano Lett 13, 2558 (2013).
[2] V. Křápek et al., Opt. Express 23, 11855 (2015).