Mainz 2017 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
A: Fachverband Atomphysik
A 14: Highly Charged Ions
A 14.5: Vortrag
Dienstag, 7. März 2017, 15:30–15:45, HS 20
A novel off-axis gun for electron beam ion traps — •Steffen Kühn1, Sven Bernitt1,2, Thore M. Bücking1, André Cieluch1, Peter Micke1,3, Thomas Stöhlker2, and José R. Crespo López-Urrutia1 — 1Max-Planck-Institut für Kernphysik, Heidelberg, Germany — 2IOQ, Friedrich-Schiller-Universität Jena, Germany — 3Physikalisch-Technische Bundesanstalt, Braunschweig, Germany
In an electron beam ion trap (EBIT) highly charged ions (HCIs) are produced using an electron beam compressed to very high densities, which sequentially ionizes atoms. EBITs usually employ on-axis electron guns blocking the view along the trap axis. This can constitute a limitation for certain applications like laser spectroscopy where the photon beam is lost hitting the gun. A novel off-axis gun (OAG) was built with the cathode displaced from the central axis, which is therefore free of any obstacles and the photon beam is available for further experiments downstream. One of the envisaged applications is using HCIs as a new in situ calibration standard for high energy photon beams as provided e.g. by synchrotrons. First performance checks in a compact 0.86 T permanent magnet EBIT have shown stable operation with a 20 mA electron beam and up to 10 keV beam energy.