Mainz 2017 – scientific programme
Parts | Days | Selection | Search | Updates | Downloads | Help
A: Fachverband Atomphysik
A 16: XUV/X-ray spectroscopy III
A 16.2: Talk
Tuesday, March 7, 2017, 15:00–15:15, N 2
Towards XUV metrology with Highly Charged Ions using a HHG frequency comb — •Janko Nauta1, Andrii Borodin1, Julian Stark1, Peter Micke1,2, Lisa Schmöger1,2, Maria Schwarz1,2, José Crespo López Urrutia1, and Thomas Pfeifer1 — 1Max-Planck-Institut für Kernphysik, Heidelberg, Germany — 2Physikalisch-Technische Bundesanstalt, Braunschweig, Germany
Highly charged ions (HCI) are atomic systems with only a few tightly bound electrons and offer many advantages over neutral and singly charged ions for probing fundamental physics. For example, HCI are intrinsically sensitive to a possible variation of the fine-structure constant α. Moreover, they have been recently proposed as candidates for novel frequency standards, because their low polarizability makes them insensitive to black body radiation and laser-induced shifts [1].
To this end, our project aims at studying trapped HCI, cooled down to mK temperatures [2], with ultra-high precision in the extreme ultraviolet (XUV) regime. We will use high harmonic generation (HHG) to coherently transfer the modes of an infrared frequency comb to the XUV, and then plan to perform direct frequency comb spectroscopy. To amplify the femtosecond pulses we are developing an enhancement cavity, with a focus waist size smaller than 15 µm in order to reach intensities of 1014 W/cm2, enabling for intra-cavity HHG. The experimental approach and first results of the new enhancement cavity will be presented.
[1] A. Derevianko et al., Phys. Rev. Lett. 109, 180801 (2012)
[2] L. Schmöger et al., Science 347, 6227 (2015)