Mainz 2017 – wissenschaftliches Programm
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A: Fachverband Atomphysik
A 26: Poster Session II
A 26.37: Poster
Mittwoch, 8. März 2017, 17:00–19:00, P OG1
Simulation of CEP-dependent above-threshold ionization with few-cycle laser pulses at 1800 nm — •Yinyu Zhang1,2, Danilo Zille1,2, Philipp Kellner1, Daniel Adolph1,2, Daniel Wüzler1,2, Philipp Wustelt1,2, Max Möller1, Arthur Maxwell Sayler1,2, and Gerhard G. Paulus1,2 — 1Institut für Optik und Quantenelektronik, Max-Wien-Platz 1, 07743, Jena, Germany — 2Helmholtz Institut Jena, Fröbelstieg 3, 07743, Jena, Germany
The carrier-envelope(CE)-phasemeter, which is based on a stereographic above-threshold ionization (ATI) measurement, has been proven to be a precise, real-time, single-shot CEP tagging and pulse length characterization technique at 800 nm [1]. However, for longer wavelengths, the higher ponderomotive energy increases electron return energies. This reduces the scattering probability and thus reduces the corresponding yield of the high energy back-scattered electrons detected by the CE-phasemeter, which makes the measurements challenging. Nevertheless, recent preliminary results have shown that determination of the CEP of 1800 nm pulses using stereo-ATI of Xenon is possible. Here, the stereo-ATI spectra in few-cycle pulses at 1800 nm are simulated using the semi-classic three-step model of strong-field ionization and are compared with experimental results. The simulation results provide guidelines for optimizing CE-phasemeter technology to allow measurements at longer wavelength with increased precision. [1]T.Rathje et al.J.Phys.B:At.Mol.Opt.Phys.45(2012)074003