Mainz 2017 – wissenschaftliches Programm

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A: Fachverband Atomphysik

A 27: Laser Applications: Optical Measurement Technology (with Q)

A 27.2: Vortrag

Donnerstag, 9. März 2017, 11:30–11:45, P 5

"Single Pixel" Imaging and its application in beam profile analysis — •Daniel Laukhardt, Till Mohr, Sébastien Blumenstein, and Wolfgang Elsäßer — Technische Universität Darmstadt, Darmstadt, Germany

Nowadays it is not implicitly necessary to make use of high resolution cameras in order to get spatial resolved images. With the progress of computational capacity the application of single pixel detectors appeared more frequently in the scope of imaging. To achieve spatial resolution in this single pixel detector concept, a set of particular masks is needed which is sequentially projected onto the object, providing the spatial information. This task can be fulfilled by digital micromirror devices (DMD) which have the advantage of a high reflectivity in a broad wavelength range. Recent applications of single pixel imaging range from real time 3D imaging in the visible spectrum [1] to imaging in the terahertz spectral region [2].

In this contribution, we perform beam profile analysis using the single pixel imaging concept for a large wavelength span using a DMD and three different single pixel detectors. Thereby we are able to measure the beam profile of different light sources covering the range from the blue visible to the mid infrared spectral region.

[1] B. Sun et al., Science, Vol. 340, Issue 6134, pp. 844-847 (2013)

[2] W. L. Chan et al., Appl. Phys. Lett., Vol. 93, 121105 (2008)