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A: Fachverband Atomphysik
A 8: XUV/X-ray spectroscopy II
A 8.3: Vortrag
Montag, 6. März 2017, 18:00–18:15, N 2
X-ray laser spectroscopy with few-electron highly charged ions — •Sven Bernitt1,2 and José R. Crespo López-Urrutia2 — 1IOQ, Friedrich-Schiller-Universität Jena, Germany — 2Max-Planck-Institut für Kernphysik, Heidelberg, Germany
Electronic transitions in few-electron highly charged ions are prominent in a variety of astrophysical and laboratory plasmas, and high precision spectroscopic data is indispensable for the interpretation of their X-ray spectra.
We have used a transportable electron beam ion trap (EBIT) to provide helium- and lithium-like ions of different elements as targets for monochromatized X-rays from synchrotron and free-electron laser light sources. By detecting resonantly excited fluorescence as a function of the photon energy, we were able to perform high precision spectroscopic studies, yielding transition energies, natural line widths and branching ratios.
This also serves as benchmark for the possible use of highly charged ions as future X-ray wavelength standards, and allows us to test current atomic theories, including electron-electron interactions, on the level of QED contributions.