Münster 2017 –
wissenschaftliches Programm
HK 36: HK+T Joint Session VI: Radiation Damage
Mittwoch, 29. März 2017, 16:45–19:00, F 234
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16:45 |
HK 36.1 |
Proton-energy dependent damage to Si sensors — •Elena Donegani, Eckhart Fretwurst, and Erika Garutti
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17:00 |
HK 36.2 |
X-ray dose and electric field dependence of oxide charges at the Si-SiO2 interface of high-ohmic Si — •Ioannis Kopsalis, Eckhart Fretwurst, Erika Garutti, Robert Klanner, and Joern Schwandt
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17:15 |
HK 36.3 |
Studies of radiation field impact on microstrip sensors for the CBM Silicon Tracking System — •Ievgeniia Momot, Olga Bertini, Maksym Teklishyn, Anton Lymanets, Hanna Malygina, Johann Heuser, and Christian Sturm for the CBM collaboration
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17:30 |
HK 36.4 |
Characterization and calibration of radiation-damaged double-sided silicon strip detectors — •Levent Kaya, Andreas Vogt, Peter Reiter, Benedikt Birkenbach, Rouven Hirsch, Christian Stahl, and Norbert Pietralla
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17:45 |
HK 36.5 |
Applikations- und Bestrahlungsstudien für die Wire-Bond-Enkapsulierung in zukünftigen Siliziumsensormodulen des CMS Spurdetektors — Tobias Barvich, Felix Boegelsbacher, Alexander Dierlamm, •Stefan Maier und Pia Steck
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18:00 |
HK 36.6 |
Dark Current of Neutron Irradiated SiPMs — •Svenja Nadine Sonder, Matteo Centis Vignali, Erika Garutti, Robert Klanner, and Jörn Schwandt
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18:15 |
HK 36.7 |
Study of GEM ageing effects for the ALICE TPC Upgrade — •Michael Jung, Harald Appelshäuser, Chilo Garabados, and Renato Negrao de Oliveira for the ALICE collaboration
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18:30 |
HK 36.8 |
Radiation Tolerance of a Fully Depleted CMOS Monolithic Active Pixel Sensor — •Tobias Bus, Michael Deveaux, and Benjamin Linnik for the CBM-MVD collaboration
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18:45 |
HK 36.9 |
Einsatzmöglichkeiten von synthetischem Graphit in zukünfitgen Spurdetektoren — Tobias Barvich, Conny Beskidt, Wim de Boer, Alexander Dierlamm und •Stefan Maier
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