Münster 2017 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 116: Detektorsysteme 4

T 116.5: Vortrag

Donnerstag, 30. März 2017, 17:50–18:05, VSH 17

Reducing the systematic uncertainty of the integrated luminosity at the CMS experiment — •Joscha Knolle and Andreas B. Meyer — DESY, Hamburg, Germany

The integrated luminosity for a given dataset of the CMS experiment is computed from the event rate measurements of certain detectors, the luminosity monitors. Its uncertainty is a dominant systematic uncertainty in many cross section measurements.

A series of Van der Meer (VdM) scans is performed to calibrate the luminosity monitors. During a VdM scan, the colliding beams are scanned in steps across one another in opposite directions in the transverse plane of the detector. From the measurement of event rates in the luminosity monitors, the calibration constants for the conversion of the measured event rate to instantaneous luminosity can be determined.

In my talk, I will present studies towards the reduction of the systematic uncertainty of the integrated luminosity for the data collected in 2015 and 2016 at the CMS experiment.