Münster 2017 – scientific programme
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T: Fachverband Teilchenphysik
T 44: Pixeldetektoren 2 (gemeinsam mit HK)
T 44.4: Talk
Tuesday, March 28, 2017, 11:50–12:05, F 073
Performance Studies of Belle II DEPFET Pixel Ladders in Test Beams — •Philipp Wieduwilt, Ulf Stolzenberg, Harrison Schreeck, Benjamin Schwenker, and Ariane Frey — Georg-August-Universität Göttingen
The construction of the new e+e−-accelerator at the Japanese Flavour Factory (KEKB) has been finalized and the commissioning of its detector experiment (Belle II) is planned to be finished early 2017. The improved e+e− collider "SuperKEKB" will deliver an instantaneous luminosity of 8·1035 cm−2s−1, which is 40 times higher than the world record set by KEKB. In order to be able to fully exploit the increased number of collision events, and to provide high precision measurements of the decay vertices of the B meson systems in such a harsh environment, the Belle II detector will be equipped with a newly developed silicon vertex detector, which is based on the DEPFET technology. The DEPFET pixels are field effect transistors on a fully depleted silicon bulk and they combine signal detection and amplification per pixel. The new pixel detector is located closest to the interaction point and consists of two layers of active pixel sensors. Belle II will use DEPFET sensors thinned to 75 µm with low power consumption and low intrinsic noise. Beam test campaigns were conducted in order to study the performance of the pixel sensor modules. This talk will present the collected results of the April 2016 beam test and performance studies of the latest front-end read-out ASIC designs.