Münster 2017 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 91: Streifendetektoren 2 (gemeinsam mit HK)
T 91.7: Vortrag
Mittwoch, 29. März 2017, 18:15–18:30, F 102
Electrical quality assurance of silicon microstrip sensors for the CBM experiment — •Iaroslav Panasenko for the CBM collaboration — Physikalisches Institut, Universität Tübingen, Germany — Institute for Nuclear Research, Kiev, Ukraine
The CBM experiment at FAIR will investigate the properties of nucler matter at extreme conditions created in ultrarelativistic heavy-ion collisions. Its core detector — the Silicon Tracking System (STS) — will determine the momentum of charged particles from beam-target interactions.
The STS will be constructed from about 900 double-sided silicon microstrip sensors with 58 µm pitch and a total area of about 4 m2 with all together 2.1 million channels will be read out.
In this talk the electrical quality assurance of double-sided silicon microstrip sensors will be discussed. For this purpose dedicated equipment including a custom-built probe station has been set up in the clean room at Tübingen University. Results of the electrical characterization of prototype microstrip sensors CBM06 will be presented, which include basic checks like current-voltage and capacitance-voltage measurements, as well as specific tests like coupling and interstrip capacitances.
Work supported by BMBF under grant 05P12VTFCE.