Berlin 2018 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 3: Organic Electronics and Photovoltaics - Layer Morphology and Molecular Aggregation

CPP 3.1: Hauptvortrag

Montag, 12. März 2018, 09:30–10:00, C 243

Time-resolved in-situ x-ray scattering to resolve structure formation in thin film processing — •Eva M. Herzig — Universität Bayreuth, Physikalisches Institut, Herzig Group - Dynamik und Strukturbildung, 95440 Bayreuth, Germany

The nanomorphology of thin films determines a wide range of physical properties and therefore the performance of functional thin films. Typical examples are found in organic electronics as in organic or hybrid photovoltaics. Understanding the self-assembly processes that occur during the drying of the photoactive film, will allow us to make progress in controlled nanomorphology tuning. We have developed tools to investigate thin film formation processes using synchrotron radiation to resolve structural developments with time [1]. We can control various processing parameters to systematically investigate the influence of these parameters on the final thin film morphology. This allows us, for example, to resolve the temporal evolution of polymer crystallization processes [2]. We complement the structural analysis with time-resolved spectroscopy measurements to gain further understanding on the structure formation processes. In this talk, the influence of the deposition environment is discussed and its role for controlling the thin film morphology and the resulting material properties. - - - [1] S. Pröller et al. "Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films" Rev. Sci. Instrum. 2017, 88(6): 066101. [2] S. Pröller et al. "Following the Morphology Formation In Situ in Printed Active Layers for Organic Solar Cells" Adv. Energy Mater. 2016, 6(1): 1501580.