Berlin 2018 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 49: Soft Matter Physics: Emerging Topics, New Instruments and Methods

CPP 49.8: Vortrag

Mittwoch, 14. März 2018, 17:00–17:15, C 230

In-situ R-SoXS study of the structure formation during solvent annealing in organic thin films for application in photovoltaics — •Mihael Coric¹, Isvar Cordova², Gregory Su², Feng Liu³, Cheng Wang², and Eva M. Herzig^1,4 — ¹TU München, Munich School of Engineering, Herzig Group, 85748 Garching, Germany — ²Advanced Light Source, Lawrence Berkeley National Laboratory, 94720 Berkeley, USA — ³Department of Physics and Astronomy, Shanghai Jiaotong University, 200240 Shanghai, China — ⁴Universität Bayreuth, Physikalisches Institut, Herzig Group - Dynamik und Strukturbildung, 95440 Bayreuth, Germany

Resonant X-ray scattering (R-SoXS) at the carbon edge is now an established, very powerful tool for the analysis of structure and morphology formation in organic thin films. Since soft X-rays have a very low penetration depth and strong air scattering, samples need to be measured in high vacuum, but offer a much higher contrast than hard X-rays. However, in regards to the examination of structure formation, in-situ studies are essential to achieve a better understanding of the formation processes taking place in thin films. In this work, we present a method using the well-known R-SoXS technology with a setup that enables us to execute in-situ studies under a steady flow of vapor inside the vacuum chamber. We will show that it is possible to track changes in the morphology of organic thin film materials during a solvent annealing process. In combination with in-situ UV-Vis measurements, we are able to gain a better understanding of the structure and formation processes involved.