Berlin 2018 – scientific programme
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DS: Fachverband Dünne Schichten
DS 11: Thin Film Properties: Structure, Morphology and Composition (XRD, TEM, XPS, SIMS, RBS, AFM, ...): Session II
DS 11.2: Talk
Tuesday, March 13, 2018, 09:45–10:00, H 0111
Experimental and computational analysis of grain growth in ultrafine-grained thin films — •Ahu Öncü1, Thorsten Halle2, and Dana Zöllner3 — 1Institute of Experimental Physics, Otto-von-Guericke University Magdeburg, Germany — 2Institute of Materials and Joining Technology, Otto-von-Guericke University Magdeburg, Germany — 3B CUBE Center for Molecular Bioengineering, Technische Universität Dresden, Germany
Grain microstructures of polycrystalline solids have an immense impact on materials properties. While investigations of bulk materials it is generally assumed that surfaces or interfaces are negligible. For thin films, surface effects are very important. If during grain growth in such films the average grain size reaches the order of the layer thickness, grain growth slows down or even comes to a halt. Analytic theories of nano- and microcrystalline grain growth of thin films are often in good agreement with numerical results using computer simulations, analytic size distributions or topological correlations between grains rarely capture the experimental features. One reason for this disagreement can be found in the simple fact that the experimental samples are of 3D nature, but are commonly measured in 2D and compared to 2D simulations. In the present work, we analyze the grain microstructures of ultrafine-grained thin metallic films experimentally and compare the results to 3D computer simulations.