Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 18: Optical Analysis of Thin Films (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...): Session I

DS 18.1: Hauptvortrag

Mittwoch, 14. März 2018, 09:30–10:00, H 0111

Infrared nanopolarimetric analysis of structure and anisotropy of thin films — •Karsten Hinrichs and Timur Shaykhutdinov — Leibniz-Institut für Analytische Wissenschaften - ISAS e.V., Schwarzschildstr. 8, 12489 Berlin, Germany

IR spectroscopic techniques can deliver simultaneously high chemical and structural contrast, be coupled with optical models and numerical calculations and typically are non-destructive and label-free. In this contribution recent progress and perspectives in IR spectroscopic nanopolarimetric analysis (30 nm resolution) using an extended version of a photothermal IR nanoscopy (AFM-IR) technique are presented. In particular, several highly sensitive polarization dependent nanoscale studies of anisotropic thin film materials, as polymer, protein and polaritonic films as well as supramolecular aggregates are discussed.[1-4]

[1] T. Shaykhutdinov et al, Supramolecular Orientation in Anisotropic Assemblies by Infrared Nanopolarimetry, ACS Macro Lett. 2017. 6: 598-602.

[2] K. Hinrichs et al, Electrochemical Modification of Large Area Graphene and Characterization by Vibrational Spectroscopy, in K. Wandelt (ed.), Encyclopedia of Interfacial Chemistry, Elsevier (2018).

[3] T. Shaykhutdinov et al, Mid-infrared nanospectroscopy of Berreman mode and epsilon-near-zero local field confinement in thin films, Opt. Mater. Express 2017. 7: 3706-3714.

[4] F. Rösicke et al, Functionalization of any substrate using covalently modified large area CVD graphene, Chem. Comm. 2017. 53: 9308-9311.