Berlin 2018 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 2: 2D Materials: Session I (joint session DS/CPP/HL)

DS 2.8: Vortrag

Montag, 12. März 2018, 11:30–11:45, H 2032

Spectroscopic characterization of the silicene multi-layer phase on Ag(111) — •Dmytro Solonenko¹, Sandhya Chandola², Eugen Speiser², Norbert Esser², Dietrich R.T. Zahn¹, and Patrick Vogt¹ — ¹Semiconductor Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany — ²Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V., 12489 Berlin, Germany

The formation of so-called “multi-layer silicene” has been suggested to form for supramonolayer Si coverages on Ag(111)[1], but its nature is still controversially discussed including silicene multi-layers, bilayers or Ag-mediated growth of bulk Si with a Ag-terminated (√3×√3)R30^∘ reconstruction[2]. However, the experimental results which were shown so far do not allow an unequivocal assignment of this phase to any of the suggested structures. In order to retrieve the structural properties of this (√3×√3)R30^∘ structure, we carried out an in situ Raman spectroscopy study varying the Si coverage (up to 10 monolayers). Our results show a unique spectral signature, which does not bear any resemblance to monolayer epitaxial silicene[3]. We compare the Raman results to those for the (√3×√3)R30^∘ Ag/Si(111) system, yielding the similarities in terms of the overall number of spectral bands and their positions but also suggests fundamental differences, hinting towards the formation of a Si bilayer.

[1] Vogt, P., et al., Appl. Phys. Lett. 104, 021602 (2014). [2] Borensztein, Y., et al., Phys. Rev. B 92, 155407 (2015). [3] Solonenko, D., et al., 2D Mat. 4, 015008 (2017).