DS 22: Optical Analysis of Thin Films (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...): Session II
Mittwoch, 14. März 2018, 15:00–15:45, H 0111
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15:00 |
DS 22.1 |
Giant Circular Dichroism of Enantiopure Prolinol-Derived Squaraine J-Aggregate Thin Films probed by Mueller Matrix Spectroscopy — •Manuela Schiek, Matthias Schulz, Jennifer Zablocki, Oliya S. Abdullaeva, Arne Lützen, Frank Balzer, and Oriol Arteaga
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15:15 |
DS 22.2 |
Temperature dependent dielectric function of CuI — •Evgeny Krüger, Vitaly Zviagin, Chang Yang, Rüdiger Schmidt-Grund, and Marius Grundmann
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15:30 |
DS 22.3 |
Interface states revealed by DFT calculation of reflectance anisotropy spectroscopy: GaP on Si(001) — •Charles Patterson and Pankaj Kumar
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