Berlin 2018 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 23: Lithography II: Focused Electron Beam Induced Processing: 3D Nano-Printing for Material Science (Focussed Session): Afternoon Session (joint session DS/KFM)

DS 23.9: Vortrag

Mittwoch, 14. März 2018, 17:15–17:30, H 2032

Ac response of nano-granular metals prepared via FEBID — •Marc Hanefeld and Michael Huth — Physikalisches Institut, Goethe Universität, Max-von-Laue-Str. 1, 60438 Frankfurt am Main, Germany

Granular metals are of great interest for material sciences due to their diverse electronic transport properties and can generally be described as metallic nanoparticles surrounded by a dielectric amorphous matrix. They show promising possibilities for applications in different sensing mechanisms [1] and pose a topic of ongoing research concerning their response to a time-dependant ac stimulus [2].

Focused Electron Beam Induced Deposition (FEBID) is a versatile technique to create nano-granular metals comprising a variety of elements and a high tunability of the samples properties. Additionally, electron irradiation is the perfect tool to tune important conduction parameters like the inter-grain coupling strength and the volume fraction of the crystallites compared to the surrounding matrix, ultimately influencing the conductance regime of the deposits. In our group we have a wide knowledge about Pt(C)-FEBID deposits and the effect of electron irradiation upon them, as well as their dc electronic transport properties [1]. We will present first measurements on the ac response of such deposits and show the capabilities of FEBID to create an ideal model environment for an in depth analysis of the ac conduction characteristics of granular metals depending on their properties.

[1] Huth, et al., Microelect. Eng. 2017. doi:10.1016/j.mee.2017.10.012.

[2] Bakkali, et al., Sci. Rep. 2016;6:29676. doi:10.1038/srep29676.