Berlin 2018 – scientific programme
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DS: Fachverband Dünne Schichten
DS 31: Poster Session II
DS 31.21: Poster
Thursday, March 15, 2018, 11:15–13:15, Poster F
Direct observation of defect evolution in 2D single layer tungsten diselenide by low voltage high resolution transmission electron microscopy — •Robert Leiter, Yueliang Li, and Ute Kaiser — Electron Microscopy Group of Materials Science, University of Ulm, Albert- Einstein Allee 11, 89081 Ulm, Germany
Defects in two-dimensional transition metal dichalcogenides (TMDs) have received increasing attention in recent years due to their influence on their extraordinary mechanical, electrical, magnetic and optical properties. By controlled electron irradiation under the transmission electron microscope, such defects may tailor a material’s unique properties. [1,2]
In this work, defect evolution in WSe2 was observed in real time using our novel Cc- and Cs - corrected SALVE (Sub Ångström Low Voltage Electron microscopy) instrument [3] with atomic resolution. The combination of high time- and spatial resolution enabled the observation of many intermediate states, atom-by-atom and provides deeper understanding of its formation dynamics.
| [1] | Y.-C. Lin et al., Nat. Commun. 6, 6736 (2015) |
| [2] | H.-P. Komsa and A. V. Krasheninnikov, |
| Adv. Electron. Mater. 3, 1600468 (2017) | |
| [3] | M. Linck et al., Phys. Rev. Lett. 117, 076101 (2016) |