Berlin 2018 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 13: Poster Session I

HL 13.35: Poster

Montag, 12. März 2018, 17:30–19:30, Poster B

Investigation of Pr_1−xCa_xMnO₃-SrTi_1−yNb_yO₃ Interfaces Using Electron Beam Induced Voltage (EBIV) — •Tobias Westphal¹, Patrick Peretzki¹, Tobias Meyer¹, Birte Kressdorf², Christian Jooß², and Michael Seibt¹ — ¹4th Physical Institute, Georg-August-Universität Göttingen, 37077 Göttingen, Germany — ²Institute of Material Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany

P-n heterojunctions consisting of the p-doped manganite Pr_1−xCa_xMnO₃ (PCMO) and the n-doped titanite SrTi_1−yNb_yO₃ (STNO), both perovskite-structured, have been investigated with Electron Beam Induced Current (EBIC). To further study the photovoltaic properties of this system, the Electron Beam Induced Voltage (EBIV) technique is used in this work. The standard form for EBIV models predicts a behaviour logarithmic to the EBIC, which is useful for measuring the nanometer scale diffusion length of minority charge carriers in this system.

To investigate the interface of PCMO-STNO, both a wedge shaped lamella and a cleaved cross section are prepared to perform cross-section measurements. Focused Ion Beam is used for lamella preparation and cleaning the cleaved edge. The temperature dependence of EBIV is measured in the range from 80 K to 300 K especially in the regime of the charge ordering temperature of PCMO (T_CO≈230 K). Beam current dependent measurements at T≈300 K are performed as well. Results show the important role of measurement time limits due to an emerging capacitance in the measure circuit at low temperature.