Berlin 2018 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 13: Poster Session I
HL 13.87: Poster
Monday, March 12, 2018, 17:30–19:30, Poster B
Probing the (opto)electronic properties of functional materials by scanning near-field optical microscopy — •Jinhui Zhong1,2, Bin Ren2, and Christoph Lienau1 — 1Institute of Physics and Center of Interface Science, Carl von Ossietzky University, 26111 Oldenburg, Germany — 2College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
Scanning near-field optical microscopy (SNOM) is a powerful tool that allows for nanoscale physical and chemical analysis. In this contribution, we first demonstrated the use of tip-enhanced Raman spectroscopy (TERS) for atomic- and molecular-level characterization of heterogeneous catalyst. With plasmon-enhanced Raman scattering effect, TERS provides simultaneous topographical and chemical information at the nano/atomic scale. We show that TERS can chemically and spatially probe the site-specific chemical (electronic and catalytic) and physical (plasmonic) properties of an atomically well-defined Pd(sub-monolayer)/Au(111) bimetallic model catalyst at 3 nm resolution in real space using phenyl isocyanide as a probe molecule. We observe a weakened NC bond and enhanced reactivity of phenyl isocyanide adsorbed at the Pd step edge compared with that at the Pd terrace. Density functional theory corroborates these observations by revealing a higher d-band electronic profile for the low-coordinated Pd step edge atoms.
We further discuss the combination of SNOM with ultrafast spectroscopy to study the nanoscale exciton properties of 2D heterostructures.