Berlin 2018 –
scientific programme
HL 17: Focussed Session: Atomic Scale Characterization
Tuesday, March 13, 2018, 09:30–13:00, EW 202
For a detailed understanding of complex semiconductor nano- and heterostructures as well as the physics
of devices based on them, a systematic determination and correlation of the structural, chemical, electronic,
and optical properties on a nanometer or atomic scale is essential. This session brings the atomic
structural and chemical imaging using scanning tunneling microscopy, atomic probe tomography, and ultra-high resolution transmission electron microscopy together with the nanoscopic mapping of the optical and electronic properties using scanning transmission microscopy cathodoluminescence spectral imaging.
Organizers: Holger Eisele(TU Berlin), Frank Bertram and Jürgen Christen (OvGU Magdeburg)
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09:30 |
HL 17.1 |
Invited Talk:
Quantitative Electron Microscopy for III/V on Silicon integration — •Kerstin Volz
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10:00 |
HL 17.2 |
Invited Talk:
Total Tomography of Nonplanar Heterostructures: Doping and Confinement Pontentials — •Lincoln Lauhon
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10:30 |
HL 17.3 |
Atomic Scale Investigation of Near Interface Defects at the SiC/SiO2-Interface: Microscopy, Atom Probe Tomography and Theory — •Dipanwita Dutta, Deb De, Elisabeth Müller, Stephan Gerstl, Stefan Goedecker, Holger Bartolf, Jörg Lehmann, Giovanni Alfieri, Massimo Camarda, Adolf Schöner, and Thomas Jung
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10:45 |
HL 17.4 |
A three dimensional structural model of antiphase domains in GaP on Si(001) — •Pascal Farin, Malte Marquardt, Celina S. Schulze, Wjatscheslav Martyanov, Andreas Beyer, Kerstin Volz, and Andrea Lenz
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11:00 |
HL 17.5 |
Structural and electronic properties of AlkInSe2/CuInSe2 (Alk = K, Rb, Cs) interfaces from density functional theory calculations — •Maria Malitckaya, Hannu-Pekka Komsa, Ville Havu, and Martti Puska
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11:15 |
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15 min. break.
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11:30 |
HL 17.6 |
Invited Talk:
Modulating electron beams in space and time to probe for genuine structures and function at the atomic scale — •Christian Kisielowski
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12:00 |
HL 17.7 |
Invited Talk:
Advanced Nano-scale Characterization of Nitrides using Helium Temperature Scanning Transmission Electron Microscopy Cathodoluminescence — •Gordon Schmidt
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12:30 |
HL 17.8 |
Invited Talk:
Tip-enhanced Raman spectroscopy in semiconductor nanostructures and graphene — Emanuele Poliani and •Janina Maultzsch
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