Berlin 2018 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 24: Poster Session II

HL 24.11: Poster

Tuesday, March 13, 2018, 18:30–20:30, Poster F

Designing a charge counter for a single electron counting scanning tunneling microscope — •Felix Jekat¹, Benjamin Pestka¹, Sebastian Heedt², Patrick Zellekens³, Stefan Trellenkamp⁴, Werner Prost⁵, Marcus Liebmann¹, and Markus Morgenstern¹ — ¹II. Institute of Physics, RWTH Aachen University — ²QUtech, Kouwenhoven Lab, TU Delft — ³PGI-9, Forschungszentrum Jülich — ⁴PGI-8, Forschungszentrum Jülich — ⁵Center for Semiconductor Technology and Optoelectronics, University of Duisburg-Essen

Single electron counting provides access to the statistical distribution of tunneling events eventually leading to information of electronic correlations. While this approach is established in quantum devices, it has not been employed to a spatially resolving technique. We aim to implement single electron counting within a STM using indium arsenide nanowires as tips. Such nanowires have been shown to be as suitable as tungsten tips for STM [1]. Here, we show the design of a device, which should enable time-resolved detection of single electrons directly at the STM tip. To this end, we place a second nanowire in close proximity and couple the two wires via a floating gate [2]. Hexagonal boron nitride as a dielectric separates the nanowire from a set of fingergates, which enable the formation of quantum dots.
K. Flöhr et al. "Scanning tunneling microscopy with InAs nanowire tips", Appl. Phys. Lett. 101, 243101 (2012) [2] Y. Hu et al. "A Ge/Si heterostructure nanowire-based double quantum dot with integrated charge sensor", Nature Nanotechnol. 2, 622 (2007)