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HL: Fachverband Halbleiterphysik

HL 45: Organic photovoltaics and electronics

HL 45.8: Vortrag

Donnerstag, 15. März 2018, 17:00–17:15, EW 203

Defect Patterns of Thin Film PV Devices: Imaging Experiments vs. Electric Circuit Simulations — •Daniel Fluhr¹, Marco Seeland², Burhan Muhsin³, Stefan Krischok¹, and Harald Hoppe³ — ¹Institute of Physics, Technische Universität Ilmenau, 98693 Ilmenau, Germany (D) — ²Institute for Computer and Systems Engineering, Technische Universität Ilmenau, 98693 Ilmenau, D — ³Center for Energy and Environmental Chemistry Jena (CEEC Jena), Friedrich Schiller University Jena, 07743 Jena, D

Defects and degradation are important issues for low cost photovoltaics. Laterally resolving imaging techniques have already proven their ability for resolving the location of performance decreasing problems. A one to one correlation between physical defect types and imaging measurement features cannot be established on a single imaging method alone. However, a combination of several measurement methods is suitable to distinguish different defect types. We classify defects by their electrical properties and correlate them with three different imaging techniques by simulation and experiment. The imaging techniques investigated are Electroluminescence Imaging, Light-Beam Induced Current mapping and Dark Lock-In Thermography. Our software is based on electrical simulations of a resistive network of diodes. The locally resolved current and voltage distributions are used for computing. We simulate a variety of defect types and correlate their electrical properties to fingerprints of the imaging methods. We confirm our findings by comparing with experiments with artificially induced defects and observe good agreement of the defect patterns.