Berlin 2018 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 46: Quantum dots and wires: Optical properties III
HL 46.9: Talk
Thursday, March 15, 2018, 17:15–17:30, A 151
Back-Focal-Plane Imaging on ZnO-Nanowires — •Christian Zietlow1, Robert Röder1, Maximilian Zapf1, Robert Buschlinger2, Ulf Peschel2, and Carsten Ronning1 — 1Institute of Solid State Physics, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany — 2Institute for Solid State Theory and -Optics, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany
Semiconductor nanowires (NW) are one of the smallest lasing sources and thus gained a lot of attention in order to achieve the required future miniaturization of optoelectronic devices. Light-matter interaction in NWs and their angular emission distribution are determined by the operating transverse laser mode and thus to the polarization of the propagating light. Since single ZnO NWs provide gain material combined with a Fabry-Pérot-Cavity, coherent laser emission can be achieved by optical pumping. The laser emission is most pronounced at the end-facets such that both interfere similar to Young*s double-slit experiment. The emerging pattern is used to characterize the transverse NW lasing modes via Fourier optics in angular-resolved Microphotoluminescence. In addition to this back-focal-plane imaging, the Stokes parameters for individual modes can be determined giving an insight into the field distribution in the NW. These results are compared to measurements performed in head-on geometry [NanoLett.2016, 16, 2878-2884] that measure the field distribution of the emission emerging out of one end-facet in direction of the NW axis. Combining both techniques provides a broader understanding of transversal mode properties