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Berlin 2018 – wissenschaftliches Programm

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 10: Spectroscopy and Microscopy I with X-rays and Ions

Dienstag, 13. März 2018, 09:30–13:40, EMH 225

Chair: Burkhard Beckhoff - Physikalisch-Technische Bundesanstalt, Berlin, Germany

09:30 KFM 10.1 Hauptvortrag: Insights into the Inside provided by Coherent X-ray Imaging — •Tim Salditt
10:00 KFM 10.2 Laboratory soft X-ray Tomography — •Aurélie Dehlinger, Julia Bränzel, Daniel Grötzsch, Robert Jung, Birgit Kanngießer, Stefan Rehbein, Christian Seim, and Holger Stiel
10:20 KFM 10.3 Tomography with extended sources — •Leon Merten Lohse, Malte Vassholz, and Tim Salditt
10:40 KFM 10.4 Imaging with Nanometer Resolution from 8 to 100 keV using Multilayer Zone Plates (MZP) — •Jakob Soltau, Tim Salditt, and Markus Osterhoff
11:00 KFM 10.5 Divide and Update: Towards Single-Shot Object and Probe Retrieval for Near-Field Holography — •Johannes Hagemann and Tim Saltditt
11:20 KFM 10.6 Multiskalige Analyse von Energiematerialien mittels Synchrotron und Focused Ion Beam — •Markus Osenberg, André Hilger, Henning Markötter, Tobias Arlt, Thomas Turek, Volker Schmidt, Joachim Binder, Ingo Manke und John Banhart
  11:40 20 min. break
12:00 KFM 10.7 Simulation of Large Solid Angle Effects for XRF Quantification - First Results — •Hanna Dierks, Lars Lühl, Konstantin Andrianov, Thomas Wilhein, and Birgit Kanngießer
12:20 KFM 10.8 Scanning Transmission X-ray Microscopy with Fluorescence Detection — •Andreas Haidl, Konstantin Andrianov, Thomas Nisius, Lars Lühl, Aurelie Dehlinger, Hanna Dierks, Birgit Kanngießer, and Thomas Wilhein
12:40 KFM 10.9 LABORATORY(CONFOCAL) MICRO-XRF ON CRYO-FIXATED BIOLOGICAL SPECIMEN — •Frank Förste, Tobias Drechsel, Ioanna Mantouvalou, and Birgit Kanngießer
13:00 KFM 10.10 micro-XRF analysis of color brilliance and dyeing techniques in ancient wool carpet fibers — •Andreas Späth, Markus Meyer, Thomas Huthwelker, Camelia N. Borca, Karl Meßlinger, Manfred Bieber, and Rainer H. Fink
13:20 KFM 10.11 Applicability of a Laboratory Scan-Free GEXRF Setup for the Investigation of Nano-Layered Samples — •Veronika Szwedowski, Jonas Baumann, Steffen Staeck, Gesa Goetzke, Ioanna Mantouvalou, Daniel Groetzsch, Wolfgang Malzer, and Birgit Kanngießer
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