Berlin 2018 – wissenschaftliches Programm

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 10: Spectroscopy and Microscopy I with X-rays and Ions

KFM 10.11: Vortrag

Dienstag, 13. März 2018, 13:20–13:40, EMH 225

Applicability of a Laboratory Scan-Free GEXRF Setup for the Investigation of Nano-Layered Samples — •Veronika Szwedowski, Jonas Baumann, Steffen Staeck, Gesa Goetzke, Ioanna Mantouvalou, Daniel Groetzsch, Wolfgang Malzer, and Birgit Kanngießer — Institut für Optik und Atomare Physik, BLiX, Technische Universität Berlin, Deutschland

Grazing Emission X-Ray Fluorescence (GEXRF) is an analytical method enabling access to information about elemental depth gradients, diffusion or doping profiles of nanoscale samples. A novel scan-free approach significantly simplifies GEXRF setups by using a position and energy dispersive detector, avoiding movable parts in the spectrometer.

The first demonstrations of the technique were shown using synchrotron radiation or laser-produced plasma sources in combination with high-prized detectors enabling fast and stable angle dependent XRF measurements.

In this work a Scan-Free GEXRF (SF-GEXRF) setup with a micro-focus rhodium X-Ray tube and a conventional CCD is introduced which will help to widen the applicability of the technique due to its simplicity and low-cost, while maintaining high efficiency. We show the investigation of two classes of multilayer samples with layer thicknesses in the low-nanometer to sub-nanometer range.