DPG Phi
Verhandlungen
Verhandlungen
DPG

Berlin 2018 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 18: Diamond II + Poster

KFM 18.10: Poster

Wednesday, March 14, 2018, 16:50–17:30, E 124

Cross-sectional Microstructure, Stress Gradients, and Mechanical Properties in Diamond Films Revealed by X-ray Nanodiffraction and Microcantilever TestingDavid Gruber1, •Nicolas Wöhrl2, Hadwig Sternschulte3, Manfred Burghammer4, Juraj Todt5, and Jozef Keckes11Department für Materialphysik, Montanuniversität Leoben, Austria — 2Faculty of Physics and CENIDE, University of Duisburg-Essen, Germany — 3Fakultät für Allgemeinwissenschaften, Hochschule Augsburg, Germany — 4ESRF, Grenoble, France — 5Erich-Schmidt-Institut, Austrian Academy of Sciences, Leoben, Austria

Ultrananocrystalline diamond (UNCD) films consist of randomly oriented diamond grains embedded in an amorphous C:H matrix. Usually, the grain size is determined by XRD or TEM, revealing information from the total UNCD film or only locally from selected areas with low statistics. Here, we present a cross-sectional X-ray nanodiffraction study of diamond multi-layers with varying grain size from microcrystalline diamond to UNCD. X-ray nanodiffraction was performed in transmission geometry using a beam diameter of 30 nm. The sample was scanned in equidistant steps, revealing depth gradients of texture, grain size and residual stress. Young's modulus and fracture stress in both UNCD and microcrystalline sublayers were measured with micro cantilevers fabricated by FIB milling. A cross-sectional nanoindenter-based mapping of Young's modulus was carried out on a slice of the layer system prepared by FIB. The results show complex gradients of microstructure, stress state and mechanical properties.

100% | Mobile Layout | Deutsche Version | Contact/Imprint/Privacy
DPG-Physik > DPG-Verhandlungen > 2018 > Berlin