Berlin 2018 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 24: Spectroscopy and Microscopy II with Positrons
KFM 24.6: Vortrag
Donnerstag, 15. März 2018, 11:40–12:00, E 124
Investigation of the porous structure of oblique angle deposited thin films with tailored architectures using Positron Annihilation Spectroscopy — •Maik Butterling1, Agustín González-Elipe2, Maciej Oskar Liedke1, Aurelio García-Valenzuela2, Rafael Alvarez Molina2, Alberto Palmero Acebedo2, Jorge Gil-Rostra2, Victor Rico Gavira2, Eric Hirschmann1, Reinhard Krause-Rehberg3, and Andreas Wagner1 — 1Institut für Strahlenphysik, Helmholtz- Zentrum Dresden-Rossendorf, Dresden, Germany — 2Laboratory of Nanotechnology on Surfaces, Instituto de Ciencia de Materiales de Sevilla (CSIC-Universidad de Sevilla), Seville, Spain — 3Insitut für Physik, Martin-Luther-Universität Halle-Wittenberg, Halle, Germany
Oblique angle deposited (OAD) thin films offer many possibilities for tailoring their microstructure for specific applications, which are typically linked with the high fraction of void space and porosity available in these thin films (typically of 50% or more from the total volume of the films) and the possibility of tailoring their microstructure in the form of slanted, chiral, zig-zag or similar nanostructures. For applications, control and precise knowledge of the porous structures is essential which can be studied by means of Positron Annihilation Spectroscopy. We will present the first results for the investigation of three different nano-columnar systems which have been studied using the slow-positron source MePS at HZDR. The MePS facility has partly been funded by the Federal Ministry of Education and Research (BMBF) with the grant PosiAnalyse (05K2013).