Berlin 2018 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 27: Postersession KFM
KFM 27.17: Poster
Donnerstag, 15. März 2018, 15:00–17:00, Poster E
In situ gas-cell for the analysis of sorption behavior on surfaces by using X-ay fluorescence and absorption spectrometry under total reflection geometry — •Cornelia Streeck1, Daniel Grötzsch2, Jan Weser1, Wolfgang Malzer2, Andreas Nutsch3, Thomas Wiesner1, Birgit Kanngießer2, and Burkhard Beckhoff1 — 1Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin, Germany — 2Technische Universität Berlin and Berlin Laboratory of innovative X-ray Technologies, Hardenbergstr. 36, 10623 Berlin, Germany — 3Helmut Fischer GmbH, Industriestraße 21, 71069 Sindelfingen
A novel measuring cell for in-situ metrology of molecules of light elements e.g. volatile organic compounds and their sorption behavior on different surfaces was developed. The cell is designed for the soft X-ray range (especially C, N, and O) and is constructed for flow-through operation in a high-vacuum chamber. It allows for the analysis of the surface under total reflection geometry with Total-Reflection X-Ray Fluorescence (TXRF) analysis and X-ray Absorption Spectroscopy (XAS). First experiments using ethanol on steel and Si-wafer surfaces were applied.