Berlin 2018 – scientific programme
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 27: Postersession KFM
KFM 27.19: Poster
Thursday, March 15, 2018, 15:00–17:00, Poster E
XAFS by an X-ray tube based laboratory spectrometer — •Sebastian Praetz1, Christopher Schlesiger1, Lars Anklamm1,3, Holger Stiel2, Wolfgang Malzer1, and Birgit Kanngießer1 — 1Institute for Optics and Atomic Physics, Technical University Berlin, Hardenbergstr. 36, 10623 Berlin, Germany — 2Max-Born-Insitut, Max Born-Straße 2a, 12489 Berlin, Germany — 3IAP e.V., Rudower Chaussee 29/31, 12489 Berlin, Germany
The spectroscopy of X-ray Absorption Fine Structure (XAFS) is a frequently used method for the investigation of the electronic structure or for the identification of chemical compounds, such as the oxidation state or coordination of functionalized materials. This technique is usually performed at synchrotron radiation facilities because of the need of a brilliant X-ray source and a high spectral resolving power. A laboratory setup would have the advantage of higher accessibility and flexibility, which would open this technique for routine analysis.
In this contribution, we will present our successfully developed X-ray tube based von Hamos laboratory XAFS spectrometer using a novel type HAPG mosaic crystal with a spectral resolving power up to E/ΔE = 4000 and a wide energy range of 4 keV to 12 keV.
We are able to measure liquid as well as solid state samples in transmission. Usual acquisition times are in the range of a few minutes to several tens of minutes. First applications will be shown, e.g. the identification of oxidation states. These results are very promising and show the capability of this spectrometer for all kinds of XAFS measurements.