Berlin 2018 – wissenschaftliches Programm
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 7: Microstructure of thin films / TEM-based Nanoanalysis
KFM 7.3: Vortrag
Montag, 12. März 2018, 15:40–16:00, E 124
Vibrational fingerprints of lithium niobate on insulator and technological aspects for domain inversion in z-cut LiNbO3 thin films — •Peter Mackwitz1, Michael Rüsing1, Kai Spychala1, Minglong Zhai3, Hui Hu3,4, Gerhard Berth1,2, and Artur Zrenner1,2 — 1Department Physik, Universität Paderborn, 33098 Paderborn, Germany — 2Center for Optoelectronics and Photonics Paderborn (CeOPP), 33098 Paderborn, Germany — 3NanoLN, 250101 Jinan, P.R. China — 4School of Physics, Shandong University, 250100 Jinan, P.R. China
For applications in the field of integrated optics especially lithium niobate on insulator (LNOI) represents a promising layer stack. Here, the outstanding nonlinear optical properties of LiNbO3 and the realizable quasi phase matching via periodic domain inversion can be combined with opportunities from functional layer sequences of thin film lithium niobate and SiO2. These offer a large built-in vertical refractive index contrast as well as strong confinements. Overall, the LNOI technology offers similar waveguide bending radii and cross-sections as the established silica on insulator technology. Within this work we report on a fundamental characterization of the vibrational properties of lithium niobate on insulator and first steps towards submicron domain inversion in z-cut thin film lithium niobate. In this context a systematic analysis for various annealing conditions interface configurations was performed by confocal Raman-spectroscopy. Furthermore here the successful periodic submicron domain patterning was demonstrated by microscopic and nonlinear imaging.