KFM 7: Microstructure of thin films / TEM-based Nanoanalysis
Monday, March 12, 2018, 15:00–18:20, E 124
![](/static/ip/plus.gif) |
15:00 |
KFM 7.1 |
Scanning Transmission Helium Ion Microscopy on 1nm Thick Carbon Nanomembranes — •Daniel Emmrich, Annalena Wolff, André Beyer, and Armin Gölzhäuser
|
|
|
![](/static/ip/plus.gif) |
15:20 |
KFM 7.2 |
Self-assembly of organic semiconducting material at the liquid-liquid interface — •Manuel Johnson, Tim Hawly, and Rainer H. Fink
|
|
|
![](/static/ip/plus.gif) |
15:40 |
KFM 7.3 |
Vibrational fingerprints of lithium niobate on insulator and technological aspects for domain inversion in z-cut LiNbO3 thin films — •Peter Mackwitz, Michael Rüsing, Kai Spychala, Minglong Zhai, Hui Hu, Gerhard Berth, and Artur Zrenner
|
|
|
![](/static/ip/plus.gif) |
16:00 |
KFM 7.4 |
Dopant distribution and octahedral distortions at superconducting complex oxide bilayer interfaces — Y. Eren Suyolcu, Yi Wang, •Wilfried Sigle, Federico Baiutti, Georg Cristiani, Joachim Maier, Gennady Logvenov, and Peter A. van Aken
|
|
|
![](/static/ip/plus.gif) |
16:20 |
KFM 7.5 |
A study on Amorphous Silicon Films using SAXS and SANS to distinguish nano-crystals from voids. — •Eike Gericke, Armin Hoell, Jimmy Melskens, Dragomir Tatchev, Uwe Keiderling, Robert Wendt, Simone Raoux, Klaus Rademann, and Klaus Lips
|
|
|
|
16:40 |
|
20 min. break
|
|
|
|
17:00 |
KFM 7.6 |
The contribution has been withdrawn.
|
|
|
![](/static/ip/plus.gif) |
17:20 |
KFM 7.7 |
Generation of Attosecond Electron Pulse Trains for Ultrafast Transmission Electron Microscopy — •Christopher Rathje, Katharina E. Priebe, Sergey V. Yalunin, Armin Feist, Thorsten Hohage, Sascha Schäfer, and Claus Ropers
|
|
|
![](/static/ip/plus.gif) |
17:40 |
KFM 7.8 |
Model-based geometry reconstruction of quantum dots from TEM — •Anieza Maltsi, Thomas Koprucki, Karsten Tabelow, and Tore Niermann
|
|
|
![](/static/ip/plus.gif) |
18:00 |
KFM 7.9 |
Structural properties of InGaAs Quantum dots investigated by Transmission Electron Microscopy — •Laura Meißner, Tore Niermann, and Michael Lehmann
|
|
|