Berlin 2018 – scientific programme

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MA: Fachverband Magnetismus

MA 21: Poster I

MA 21.89: Poster

Tuesday, March 13, 2018, 09:30–13:00, Poster A

Scanning electron microscopy with polarization analysis on ex-situ sputter-deposited ultrathin Ir\Co\ Pt films — •Susanne Kuhrau, Fabian Kloodt-Twesten, Jochen Wagner, Robert Frömter, and Hans Peter Oepen — Center for Hybrid Nanostructures, Universität Hamburg, Germany

Scanning electron microscopy with polarization analysis (SEMPA) is a magnetic imaging technique with the capability to measure two components of the magnetization simultaneously. Due to its surface sensitivity, samples studied with SEMPA are usually prepared in situ. Ex-situ prepared samples are generally capped to prevent oxidation during transfer. It is commonly assumed that capping with non-magnetic material in the range of nm will deteriorate the magnetic contrast, particularly with strong spin scatterer as Pt. Before the SEMPA measurement the capping layer is either removed by sputtering or dusted by Co or Fe to establish magnetic contrast. However, both methods influence the properties of the sample, either due to intermixing of the upper layers or adding additional magnetic material. By means of a wedge shaped Pt capping layer we have investigated the magnetic contrast of {Ir\Co\ Pt}_n (n=1,2) samples. Magnetic domains can be imaged up to the maximum Pt thickness of 2 nm. A contrast reduction due to oxidation as well as capping has been analyzed as a function of Pt thickness. The maximum of the magnetic contrast found around 1 nm Pt thickness, yielding 30% of the pure Co contrast.