Berlin 2018 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 27: Poster Session I

MM 27.1: Poster

Dienstag, 13. März 2018, 18:30–19:45, Poster E

Quantitative mapping of transient fields in plasmonic devices employing a novel STEM technique — •Johannes Schultz¹, Jonas Krehl¹, Axel Lubk¹, Darius Pohl², Giulio Guzzinati³, Jo Verbeeck³, and Tobias König⁴ — ¹IFF, IFW Dresden, 01069 Dresden, Germany — ²IMW, IFW Dresden, 01069 Dresden, Germany — ³EMAT, University of Antwerp, 2020 Antwerp, Belgium — ⁴IPF Dresden, 01069 Dresden, Germany

Surface plasmon polaritons (SPP) are self-sustaining resonances occurring in metallic nanoparticles. They are associated with strongly enhanced, localized electrical fields, which may be coupled to external optical excitations. SPPs can be used for the sub-wavelength control of electromagnetic fields. Based on this, novel electronic devices can be realized, for instance on-chip light spectrometers, plasmonic rectennas for the harvesting of light or LEDs and photovoltaics with a higher efficiency. SPPs can currently be mapped and hence characterized with nanometer resolution by measuring the energy-loss of a sharp electron beam in a TEM, which roughly corresponds to the z-component of the transient field. In order to record also the other components of the induced electric field, we developed a novel technique. We measure the deflection angles of inelastically scattered electrons. There, we take advantage of the fact that the measured deflection angle is proportional to the induced field components. By measuring the complete transient electric field, we comprehensively study the properties of the SPPs including associated dielectric susceptibilities and the field enhancement effect.